New developments in fabrication of high-energy-resolution analyzers for inelastic X-ray spectroscopy
نویسندگان
چکیده
In this work new improvements related to the fabrication of spherical bent analyzers for 1 meV energy-resolution inelastic X-ray scattering spectroscopy are presented. The new method includes the use of a two-dimensional bender to achieve the required radius of curvature for X-ray analyzers. The advantage of this method is the ability to monitor the focus during bending, which leads to higher-efficiency analyzers.
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عنوان ژورنال:
دوره 18 شماره
صفحات -
تاریخ انتشار 2011